发明名称 METHODS OF FORMING A SHALLOW BASE REGION OF A BIPOLAR TRANSISTOR
摘要 PURPOSE: A methods of forming a shallow base region of a bipolar transistor is provided to solve the complexity of an implanting process and costs by injecting dopant with high energy. CONSTITUTION: A methods of forming a shallow base region of a bipolar transistor is comprised of the steps: forming a first insulation layer(205)(1) on a first layer which is doped by a first dopant; forming the first floors on the substrate; changing the thickness of the first insulation layer based on a target dopant profile; and injecting the dopant of the first types into the first layer. Selection energy, based on target dopant profile and changed thickness of the first insulating layer, is inserted into the dopant.
申请公布号 KR20090105866(A) 申请公布日期 2009.10.07
申请号 KR20090028391 申请日期 2009.04.02
申请人 发明人
分类号 H01L29/73 主分类号 H01L29/73
代理机构 代理人
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