发明名称 COMPOSITIONS AND METHODS FOR CHEMICAL-MECHANICAL POLISHING OF PHASE CHANGE MATERIALS
摘要 The present invention provides a chemical-mechanical polishing (CMP) composition suitable for polishing a substrate comprising a phase change material (PCM), such as a germanium-antimony-tellurium (GST) alloy. The composition comprises a particulate abrasive material in combination with lysine, an optional oxidizing agent, and an aqueous carrier therefor. CMP methods for polishing a phase change material-containing substrate utilizing the composition are also disclosed.
申请公布号 EP2183333(A2) 申请公布日期 2010.05.12
申请号 EP20080794699 申请日期 2008.07.24
申请人 CABOT MICROELECTRONICS CORPORATION 发明人 CHEN, ZHAN;LUO, KAI;VACASSY, ROBERT
分类号 C09K3/14;B24B37/00;C09G1/02;G11C13/00;H01L21/302 主分类号 C09K3/14
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