发明名称 |
Chemical mechanical polishing composition and methods relating thereto |
摘要 |
A method for chemical mechanical polishing of a substrate comprising a germanium-antimony-tellurium chalcogenide phase change alloy using a chemical mechanical polishing composition comprising water; 1 to 40 wt% colloidal silica abrasive particles having an average particle size of ‰¤ 50 nm; and 0 to 5 wt% quarternary ammonium compound; wherein the chemical mechanical polishing composition is oxidizer free and chelating agent free; and, wherein the chemical mechanical polishing composition has a pH >6 to 12.
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申请公布号 |
EP2184330(A1) |
申请公布日期 |
2010.05.12 |
申请号 |
EP20090155072 |
申请日期 |
2009.03.13 |
申请人 |
ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC. |
发明人 |
LIU, ZHENDONG |
分类号 |
C09G1/02 |
主分类号 |
C09G1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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