发明名称 Chemical mechanical polishing composition and methods relating thereto
摘要 A method for chemical mechanical polishing of a substrate comprising a germanium-antimony-tellurium chalcogenide phase change alloy using a chemical mechanical polishing composition comprising water; 1 to 40 wt% colloidal silica abrasive particles having an average particle size of ‰¤ 50 nm; and 0 to 5 wt% quarternary ammonium compound; wherein the chemical mechanical polishing composition is oxidizer free and chelating agent free; and, wherein the chemical mechanical polishing composition has a pH >6 to 12.
申请公布号 EP2184330(A1) 申请公布日期 2010.05.12
申请号 EP20090155072 申请日期 2009.03.13
申请人 ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC. 发明人 LIU, ZHENDONG
分类号 C09G1/02 主分类号 C09G1/02
代理机构 代理人
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