发明名称 Exposure system and pattern formation method
摘要 An exposure system includes a cleaning unit for cleaning a surface of a resist film formed on a wafer with a cleaning fluid and an exposure unit for performing pattern exposure with an immersion liquid provided between the resist film and a projection lens.
申请公布号 US7713685(B2) 申请公布日期 2010.05.11
申请号 US20050143666 申请日期 2005.06.03
申请人 PANASONIC CORPORATION 发明人 ENDO MASAYUKI;SASAGO MASARU
分类号 G03F7/26;G03F7/38;G03F7/039;G03F7/16;G03F7/20;H01L21/027 主分类号 G03F7/26
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