PURPOSE: A memory test system and a test method thereof are provided to remarkably reduce testing time due to the installation of a temperature compensator. CONSTITUTION: A plurality of nonvolatile memories has temperature compensators. A tester(200) tests nonvolatile memories. The temperature compensator automatically calculates a trim value for adjusting an offset in response to a test signal of the tester. The nonvolatile memories are located on one wafer. The temperature compensator comprises a trim logic outputting a trim value according to the test signal and a temperature sensor outputting the offset voltage corresponding to the trim value outputted from the trim logic.
