发明名称 |
METHOD OF FORMING SEMICONDUCTOR DEVICE USING THE ALO MASK |
摘要 |
<p>PURPOSE: A method for forming a semiconductor device with an aluminum oxide layer mask is provided to etch vertical gate structures by forming a mask pattern which is resistant to an etching gas. CONSTITUTION: A first gate selection line(320) and a second gate selection line(710) are formed on a semiconductor substrate(1100). A gate structure(10) with a cell gate structure is formed between the first gate selection line and the second gate selection line. The gate structure includes one of a metal layer, a poly silicon layer, an oxide silicon layer, a semiconductor layer and an insulation layer. A mask pattern(100) based on an aluminum oxide layer is formed on the gate structure. The gate structure is etched using the mask pattern as an etching mask. A channel hole which passes through the each layer of the gate structure is formed.</p> |
申请公布号 |
KR20100048731(A) |
申请公布日期 |
2010.05.11 |
申请号 |
KR20080108014 |
申请日期 |
2008.10.31 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HAN, JE WOO;CHUNG, SEUNG PIL;KIM, DONG CHAN |
分类号 |
H01L21/027;H01L21/8247 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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