发明名称 A CIRCUIT FOR PREVENTING MALFUNCTION OF A SEMICONDUCTOR
摘要 PURPOSE: A circuit for preventing the malfunction of a semiconductor is provided to increase the stability and reliability of a semiconductor by correctly implementing the driving operation of a selective data transfer between a bit line and a input output line. CONSTITUTION: A connection part(230) is switched on by a column select signal in order to selectively interlink a bit line and input output line. A signal control unit(220) maintains the column select signal at a constant voltage in order to turn off the connection part. The signal control unit comprises an inverter and a switching element reversing the column select signal. The switching element is switched on with the output of inverter. The switching element selectively maintains the column select signal at a constant voltage.
申请公布号 KR20100048760(A) 申请公布日期 2010.05.11
申请号 KR20080108056 申请日期 2008.10.31
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, EUN SUK
分类号 G11C11/4093;G11C11/4074;G11C11/4094;G11C11/4096 主分类号 G11C11/4093
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