发明名称 |
A CIRCUIT FOR PREVENTING MALFUNCTION OF A SEMICONDUCTOR |
摘要 |
PURPOSE: A circuit for preventing the malfunction of a semiconductor is provided to increase the stability and reliability of a semiconductor by correctly implementing the driving operation of a selective data transfer between a bit line and a input output line. CONSTITUTION: A connection part(230) is switched on by a column select signal in order to selectively interlink a bit line and input output line. A signal control unit(220) maintains the column select signal at a constant voltage in order to turn off the connection part. The signal control unit comprises an inverter and a switching element reversing the column select signal. The switching element is switched on with the output of inverter. The switching element selectively maintains the column select signal at a constant voltage. |
申请公布号 |
KR20100048760(A) |
申请公布日期 |
2010.05.11 |
申请号 |
KR20080108056 |
申请日期 |
2008.10.31 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, EUN SUK |
分类号 |
G11C11/4093;G11C11/4074;G11C11/4094;G11C11/4096 |
主分类号 |
G11C11/4093 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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