发明名称 Method for fabricating dielectric on metal by baking dielectric precursor under reduced pressure atmosphere
摘要 A dielectric film production process comprising a baking step in which a dielectric film is formed by heating a precursor layer formed on a metal layer, wherein the metal layer contains at least one type of metal selected from the group consisting of Cu, Ni, Al, stainless steel and austenitic nickel-chromium-based superalloy and during at least part of the baking step the precursor layer is heated in a reduced pressure atmosphere.
申请公布号 US7713877(B2) 申请公布日期 2010.05.11
申请号 US20060508923 申请日期 2006.08.24
申请人 TDK CORPORATION 发明人 MIYAMOTO YUKI;SAITA HITOSHI
分类号 H01L21/44;H01L21/31 主分类号 H01L21/44
代理机构 代理人
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