发明名称 HIGH-POWER SEMICONDUCTOR DEVICE HAVING IMPROVED TRANSCONDUCTANCE
摘要 <p>PURPOSE: A high-power semiconductor device including improved transconductance is provided to obtain a stable breakdown voltage by forming the gate insulation layers of the semiconductor device with different thicknesses. CONSTITUTION: A first conductive semiconductor substrate(100) is prepared. A gate electrode(130) is formed on the upper side of the semiconductor substrate. A second conductive source region(140a) is formed on one side of the gate electrode. A second conductive drain region(140b) is formed on the other side of the gate electrode. A first gate insulation layer(120a) is interposed between the semiconductor substrate and the gate electrode. A second gate insulation layer(120b) is adjacent to the drain region. A third gate insulation layer(120c) is located between the first and the second gate insulation layers.</p>
申请公布号 KR20100048061(A) 申请公布日期 2010.05.11
申请号 KR20080107060 申请日期 2008.10.30
申请人 CHUNGBUK NATIONAL UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION 发明人 NA, KEE YEOL;KIM, YEONG SEUK;BAEK, KI JU
分类号 H01L29/78 主分类号 H01L29/78
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