| 摘要 |
PURPOSE: A ground signal ground test pattern and method for an RF element are provided to obtain a ground signal ground test pattern for measuring the RF element which includes optimal pitches with respect to the transverse direction of a probe pad. CONSTITUTION: A first signal pad(120) is located on the left side of an RF element(110). A second signal pad(130) is located on the right side of the RF element. A ground pad 1a(140) is located on the upper side of the first signal pad. A ground pad 1b(150) is located on the lower side of the first signal pad. A ground pad 2a(160) is located on the upper side of the second signal pad. A ground pad 2b(170) is located on the lower side of the second signal pad. |
