发明名称 Semiconductor packages with enhanced joint reliability and methods of fabricating the same
摘要 Provided is a semiconductor package with enhanced joint reliability and methods of fabricating the same. The method includes: forming package units including a semiconductor chip interposed between a bottom layer and a top layer; and sequentially stacking the package units on a substrate. The bottom layer and the top layer are formed of a material having a lower modulus than the semiconductor chip. The semiconductor package includes: at least one package unit disposed on a substrate, the package unit including a semiconductor chip having a pad, a bottom layer and a top layer substantially surrounding the semiconductor chip, and a redistribution structure overlying the top layer. The redistribution structure is electrically connected to the pad.
申请公布号 US7598607(B2) 申请公布日期 2009.10.06
申请号 US20080123367 申请日期 2008.05.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHUNG HYUN-SOO;JANG DONG-HYEON;KIM NAM-SEOG;KANG SUN-WON
分类号 H01L23/02 主分类号 H01L23/02
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