| 摘要 |
In a method for the determination of disconnection time information (DTI) significant for an inadequate power supply of an integrated circuit (2) of a data carrier (1) such as an RFID-tag. The disconnection time information (DTI) is determined on the basis of the discharge behavior of a first storage capacitor (C1), which is affected by the IC material and by radiation, and the determined disconnection time information (DTI) is corrected in dependence on the effects of the IC material and/or on at least one radiation effect.
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