发明名称 Techniques for providing a failures in time (FIT) rate for a product design process
摘要 A technique for providing a product FIT rate is performed within electronic circuitry (e.g., one or more computerized devices). The technique involves receiving a Mean Time To Failure (MTTF) target for a product and a Mean Time To Repair (MTTR) target for the product (e.g., a circuit board module). The technique further involves establishing a FIT rate based on the MTTF target and the MTTR target, and then outputting the FIT rate to a design process for the product (e.g., a circuit board design process). The FIT rate is a number of product failures expected per amount of time of product operation.
申请公布号 US7600202(B1) 申请公布日期 2009.10.06
申请号 US20060520979 申请日期 2006.09.14
申请人 EMC CORPORATION 发明人 BURNHAM STEVEN
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
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