发明名称 |
Method for marking defect and device therefor |
摘要 |
A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip. |
申请公布号 |
US7599052(B2) |
申请公布日期 |
2009.10.06 |
申请号 |
US20080228478 |
申请日期 |
2008.08.13 |
申请人 |
NKK CORPORATION |
发明人 |
UESUGI MITSUAKI;YOSHIKAWA SHOJI;INOMATA MASAICHI;KAWAMURA TSUTOMU;OSHIGE TAKAHIKO;SUGIURA HIROYUKI;KAZAMA AKIRA;SUYAMA TSUNEO;KUSHIDA YASUO;HARADA SHUICHI;TANAKA HAJIME;UEHARA OSAMU;KANETO SHUJI;IWABUCHI MASAHIRO;HARADA KOZO;TOMONAGA SHINICHI;FUKUDA SHIGEMI |
分类号 |
G01N21/00;A47L1/08;B21C51/00;G01N21/89 |
主分类号 |
G01N21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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