发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to increase production yield of a device by performing selective ion implantation and controlling the thickness of an insulation layer. CONSTITUTION: A method for manufacturing a semiconductor device is comprised of the steps: a fuse pattern(210) is formed on a semiconductor substrate(200); a first insulating layer(220) is formed on the whole surface; an impurity is injected into a fuse blowing area(270) placed on the fuse pattern through ion-implantation; and the first insulating layers are exposed to the fuse blowing area by repair-etching the second insulating layers.
申请公布号 KR20090100066(A) 申请公布日期 2009.09.23
申请号 KR20080025446 申请日期 2008.03.19
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JANG, KYEONG SIK
分类号 H01L21/82;H01L21/265;H01L21/8229 主分类号 H01L21/82
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