发明名称 Abnormality detection system, abnormality management apparatus, abnormality management method, probe and program
摘要 An abnormality management apparatus, connected via a network to a plurality of probes disposed at arbitrary positions in the network, comprises an abnormality level reception unit that receives information indicating an abnormality level calculated at each of the plurality of probes, an abnormality analysis unit that judges the scale of an abnormality manifesting in the network based upon an average value of the abnormality levels indicated at the plurality of probes and deviations relative to the average value and a result output unit that outputs results obtained at the abnormality analysis unit. The structure enables accurate assessment of the scale of an abnormality having occurred in the network and quick response to the abnormality by detecting its cause at an early stage.
申请公布号 US7594014(B2) 申请公布日期 2009.09.22
申请号 US20060498809 申请日期 2006.08.04
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 NAKAMURA NOBUYUKI
分类号 G06F15/173 主分类号 G06F15/173
代理机构 代理人
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