发明名称 Method of fabricating capacitor over bit line and bottom electrode thereof
摘要 A method of fabricating a capacitor over bit line (COB) is provided. First, a substrate is provided and a plurality of word lines is formed on the substrate. Next, a plurality of landing plug contacts (LPCs) are formed between the word lines and a plurality of first contacts is then formed on the LPCs. Thereafter, a plurality of second contacts is formed on a first portions of the first contacts and a plurality of bit lines connecting a second portions of the first contacts is formed, simultaneously. An inter-layer dielectric (ILD) layer is formed on the substrate to cover the second contacts and the bit lines. Subsequently, a plurality of capacitors is formed in the ILD layer. Thus, the fabrication of the capacitor is simplified.
申请公布号 US7592219(B2) 申请公布日期 2009.09.22
申请号 US20070624220 申请日期 2007.01.18
申请人 PROMOS TECHNOLOGIES INC. 发明人 LIN TSUNG-DE;LEE CHENG-CHE
分类号 H01L21/8242 主分类号 H01L21/8242
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