发明名称 Measuring method, measuring system, inspecting method, inspecting system, exposure method and exposure system, in which information as to the degree of the flatness of an object is pre-obtained
摘要 A reticle is loaded on a reticle measuring instrument (step S50), and the surface shape of the reticle in a state held by a reticle holder of the reticle measuring instrument is measured in advance (step S52). Because the surface shape difference between the reticle holder of the reticle measuring instrument and a reticle holder of an exposure apparatus is known, the surface shape of the reticle in a state equivalent to the state held by the reticle holder of the exposure apparatus can be calculated (step S56) by adding to the measurement results such surface shape difference.
申请公布号 US7593100(B2) 申请公布日期 2009.09.22
申请号 US20060336761 申请日期 2006.01.23
申请人 NIKON CORPORATION 发明人 OKITA SHINICHI
分类号 G01N21/00;G01B11/00 主分类号 G01N21/00
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