METHOD FOR TESTING CRYPTOGRAPHIC CIRCUITS, SECURED CRYPTOGRAPHIC CIRCUIT CAPABLE OF BEING TESTED, AND METHOD FOR WIRING SUCH CIRCUIT

摘要

The invention relates to a method for testing cryptographic circuits. The invention also relates to a cryptographic circuit that can be tested, the cryptographic circuit including registers and logic gates (211, 212, 213, 214). According to the invention, a test comprises carrying out a differential consumption analysis (DPA) of the circuit registers. In a cryptographic circuit being secured and including a first half-circuit (211, 214) combined with a second half-circuit (212, 213) operating in a complementary logic, the power supply (Vdd1, 23, 25) of the first half-circuit is separated from the power supply (Vdd2, 24) of the second half-circuit, the differential consumption analysis being carried out in parallel on each half-circuit and both power supplies being grouped together into the same power supply after the test.