发明名称 |
CAPTURE METHOD OF MICROPARTICLE, ARRANGEMENT METHOD THEREOF, AND PROBE USED FOR THE SAME |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide technology for selecting and capturing one or a plurality of microparticles, and also to provide arrangement technology for achieving the measurement of physical properties of one microparticle by arranging the captured microparticle between metal electrodes with a gap of nanometers, and further to provide a probe used for capturing and arranging the microparticle. <P>SOLUTION: A method of capturing and arranging the microparticles includes a step for preparing the probe having a metal probe mounted with a carbon nanotube at its leading end, a step for bringing the leading end of the carbon nanotube into contact with the microparticle, and a step for fixing the microparticle and the carbon nanotube by depositing amorphous carbon through focusing electronic beams at the carbon nanotube of a contact part with the microparticle. The probe is used for capturing and arranging the microparticle. <P>COPYRIGHT: (C)2009,JPO&INPIT</p> |
申请公布号 |
JP2009196041(A) |
申请公布日期 |
2009.09.03 |
申请号 |
JP20080040751 |
申请日期 |
2008.02.22 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL &, TECHNOLOGY |
发明人 |
SHIMIZU TETSUO;SUGA HIROSHI;NAITO YASUHISA |
分类号 |
B82B3/00;C01B31/02 |
主分类号 |
B82B3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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