发明名称 COMPARISON CIRCUIT APPARATUS, SERIAL INTERFACE CIRCUIT APPARATUS, AND ELECTRONIC DEVICE
摘要 PROBLEM TO BE SOLVED: To provide: a comparison circuit apparatus capable of suppressing the occurrence of variation in comparison results, and capable of downsizing without complicating the apparatus; a serial interface circuit apparatus; and an electronic device. SOLUTION: An external resistive element 13 and a current restriction resistive element 21 are provided outside an integrated circuit part 11, and an interior resistive element 14 and a pull-down resistive element 22 are closely formed in the integrated circuit part 11. A resistance value R1 of the resistive element for restricting current, a resistance value R2 of the pull-down resistive element 22, a resistance value R3 of the exterior resistive element, and a resistance value R4 of the interior resistive element satisfy a relation of R1:R2=R3:R4. A reference voltage depending on a divided voltage obtained by dividing a predetermined voltage by the interior resistive element 14 and the exterior resistive element 13 is generated by a reference voltage generating part 15. A voltage generated by the current restriction resistive element 21 and the pull-down resistive element 22, and the reference voltage generated by the reference voltage generating part 15, are compared by a comparing part 16. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009200978(A) 申请公布日期 2009.09.03
申请号 JP20080042239 申请日期 2008.02.22
申请人 FUJITSU TEN LTD 发明人 IZUMIMOTO RYO;KOMATSU KAZUHIRO
分类号 H03K5/08 主分类号 H03K5/08
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