发明名称 FLASH MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a flash memory device that improves coupling ratio of a cell and method of manufacturing the same. SOLUTION: The flash memory device includes a trench which is formed on a semiconductor substrate and has a level difference on a bottom surface, a tunnel insulating film formed on an active region of the semiconductor substrate, a first conductive film formed on the tunnel insulating film, an element isolation film to be filled between the trench and a first conductive film, and a second conductive film formed by allowing a side surface thereof to be partially superimposed with the element isolation film on the first conductive film. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009200464(A) 申请公布日期 2009.09.03
申请号 JP20080213616 申请日期 2008.08.22
申请人 HYNIX SEMICONDUCTOR INC 发明人 KUN SHATOKU
分类号 H01L21/8247;H01L21/76;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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