发明名称 NITRIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a nitride semiconductor device having an electrode with low contact resistance, the electrode being formed on a backside of a nitride semiconductor device, and to provide a method of manufacturing the same. <P>SOLUTION: The nitride semiconductor device 1 includes a substrate 2, and an n-type clad layer 3 to a p-type contact layer 9 formed as nitride semiconductor layers on an upper surface of the substrate 2. The substrate 2 has a hemispherical projection portion 13 formed on the backside 14 on the opposite side from the upper surface where the nitride semiconductor layers are formed by removing a processing deterioration layer on the backside 14. The nitride semiconductor device 1 further has an electrode 12 formed so as to be in contact with the projection portion 13. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009200332(A) 申请公布日期 2009.09.03
申请号 JP20080041721 申请日期 2008.02.22
申请人 SUMITOMO ELECTRIC IND LTD 发明人 KATAYAMA KOJI;KITABAYASHI HIROYUKI;SAITO HIROHISA
分类号 H01L21/28;H01L29/41;H01L33/06;H01L33/32;H01L33/40;H01S5/042;H01S5/323;H01S5/343 主分类号 H01L21/28
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