发明名称 |
NITRIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a nitride semiconductor device having an electrode with low contact resistance, the electrode being formed on a backside of a nitride semiconductor device, and to provide a method of manufacturing the same. <P>SOLUTION: The nitride semiconductor device 1 includes a substrate 2, and an n-type clad layer 3 to a p-type contact layer 9 formed as nitride semiconductor layers on an upper surface of the substrate 2. The substrate 2 has a hemispherical projection portion 13 formed on the backside 14 on the opposite side from the upper surface where the nitride semiconductor layers are formed by removing a processing deterioration layer on the backside 14. The nitride semiconductor device 1 further has an electrode 12 formed so as to be in contact with the projection portion 13. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009200332(A) |
申请公布日期 |
2009.09.03 |
申请号 |
JP20080041721 |
申请日期 |
2008.02.22 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
KATAYAMA KOJI;KITABAYASHI HIROYUKI;SAITO HIROHISA |
分类号 |
H01L21/28;H01L29/41;H01L33/06;H01L33/32;H01L33/40;H01S5/042;H01S5/323;H01S5/343 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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