发明名称 MANUFACTURING METHOD OF SILICON CARBIDE SEMICONDUCTOR DEVICE, AND SILICON CARBIDE SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a silicon carbide semiconductor device which can improve reliability; and a silicon carbide semiconductor device. SOLUTION: This manufacturing method of a silicon carbide semiconductor device includes the following processes of: first preparing a silicon carbide semiconductor layer 110 including a principal surface 110a; doping silicon in the principal surface 110a of the silicon carbide semiconductor layer 110 to form a high-concentration region 115 high in silicon concentration relative to a region without doping silicon in the silicon carbide semiconductor layer 110; forming metal layers 143 and 144 containing a material producing a compound with silicon at positions in contact with the high-concentration region 115; and heat-treating the metal layers 143 and 144 to form electrodes containing the compound. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009200326(A) 申请公布日期 2009.09.03
申请号 JP20080041658 申请日期 2008.02.22
申请人 SUMITOMO ELECTRIC IND LTD 发明人 TAMASO HIDETO;MASUDA KENRYO
分类号 H01L21/28;H01L21/336;H01L21/337;H01L21/338;H01L29/78;H01L29/808;H01L29/812 主分类号 H01L21/28
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