发明名称 |
MANUFACTURING METHOD OF SILICON CARBIDE SEMICONDUCTOR DEVICE, AND SILICON CARBIDE SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method of a silicon carbide semiconductor device which can improve reliability; and a silicon carbide semiconductor device. SOLUTION: This manufacturing method of a silicon carbide semiconductor device includes the following processes of: first preparing a silicon carbide semiconductor layer 110 including a principal surface 110a; doping silicon in the principal surface 110a of the silicon carbide semiconductor layer 110 to form a high-concentration region 115 high in silicon concentration relative to a region without doping silicon in the silicon carbide semiconductor layer 110; forming metal layers 143 and 144 containing a material producing a compound with silicon at positions in contact with the high-concentration region 115; and heat-treating the metal layers 143 and 144 to form electrodes containing the compound. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009200326(A) |
申请公布日期 |
2009.09.03 |
申请号 |
JP20080041658 |
申请日期 |
2008.02.22 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
TAMASO HIDETO;MASUDA KENRYO |
分类号 |
H01L21/28;H01L21/336;H01L21/337;H01L21/338;H01L29/78;H01L29/808;H01L29/812 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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