发明名称 METHOD AND SYSTEM FOR ELECTRON DENSITY MEASUREMENT
摘要 The present invention provides a diagnostic system for plasma processing (1), wherein the diagnostic system (1) comprises a multi¬ modal resonator (35), a power source (60), a detector (70), and a controller (80). The controller (80) is coupled ot hte power source (60) and the detector (70), and it is configured to provide a man-machine interface (82) for performing several monitoring and controlling functions associated with the diagnostic system (1) including: a Gunn diode voltage monitor, a Gunn diode current monit a varactor diode voltage monitor, a detector voltage monitor, a varactor voltage control, a varactor voltage sweep control, a resonanc lock-on control, a graphical user control, and an electron density monitor. The diagnostic system (1) can further provide a remote controller (84) coupled to the controller (80) and configured to provide a remote man-machine interface (86). The remote man-mach interface (86) can provide a graphical user interface in order to permint remote control of the diagnostic system (1) by an operator. I addition, the present invention provides several methods of controlling the diagnostic system (1) in order to perform both monitor an control functions.
申请公布号 WO2004010151(A3) 申请公布日期 2009.09.03
申请号 WO2003US19872 申请日期 2003.07.23
申请人 TOKYO ELECTRON LIMITED;STRANG, ERIC, J.;PARSONS, RICHARD;GOLDFIELD, JODY 发明人 STRANG, ERIC, J.;PARSONS, RICHARD;GOLDFIELD, JODY
分类号 G06F11/30;H01J37/32 主分类号 G06F11/30
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