| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method of improving or stabilizing occurrence of a characteristic failure of a semiconductor light-emitting element that may cause a quality failure in future due to sticking of extraneous materials to lateral surfaces of the semiconductor light-emitting element, and easily detecting and classifying the failure by a characteristic inspection. <P>SOLUTION: The method of inspecting a semiconductor light-emitting element includes steps of performing organic processing or etching processing on a semiconductor light-emitting element 1, and heat-treating it at a high temperature to firmly fix extraneous materials 10 to the semiconductor light-emitting element 1 and make them conductive, before inspecting its characteristics. Thus, failures are certainly detected by a characteristic inspection. <P>COPYRIGHT: (C)2009,JPO&INPIT</p> |
