| 摘要 |
PROBLEM TO BE SOLVED: To provide an integrated circuit which can make its operation test solely by itself. SOLUTION: The integrated circuit 1 is an integrated circuit to constitute a semiconductor memory 100 through connection with semiconductor memories 9. It has a BIST (Built-In Self-Test) circuit 3 to produce a write request 301 containing dummy data 303 when a start signal is applied from the outside, a memory control circuit 6 to output the dummy data as the write data in response to the write request, and a read data selector circuit 10 to loop back the write data to the memory control circuit. The memory control circuit has a register 31 to hold the write data looped back by the read data selector circuit, and outputs a defect signal by finding out trouble in regular operation. COPYRIGHT: (C)2009,JPO&INPIT
|
