发明名称 INSPECTION DEVICE AND INSPECTION METHOD OF ELECTROOPTICAL DEVICE
摘要 PROBLEM TO BE SOLVED: To detect a gap of a liquid crystal panel in a vertical orientation system with high accuracy by a hue system. SOLUTION: An inspection device is equipped with: a light source 21; the first polarizing plate 22 for polarizing light from the light source; the second polarizing plate 25 arranged on an outgoing optical path of the liquid crystal panel, in the vertical orientation system entered by polarized light from the first polarizing plate; at least one phase difference plate 23, 24 arranged on the outgoing optical path of the liquid crystal panel between the liquid crystal panel and the second polarizing plate; a photodetection part 26 for detecting the light transmitted through the second polarizing plate; and a gap detection part 27 for detecting a gap of the liquid crystal panel by the hue of light detected by the detection part. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009198354(A) 申请公布日期 2009.09.03
申请号 JP20080041074 申请日期 2008.02.22
申请人 SEIKO EPSON CORP 发明人 MURAKAMI KENJI
分类号 G01M11/00;G02F1/13 主分类号 G01M11/00
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