发明名称 Methods For Producing Quartz Parts With Low Defect And Impurity Densities For Use In Semiconductor Processing
摘要 Described are methods and chemistries for preparing firepolished quartz parts for use in semiconductor processing. The quartz parts in need of preparation include newly manufactured parts as well as parts requiring refurbishment after previous use in semiconductor processing. The embodiments described avoid methods and chemistries that may damage the surfaces of the quartz parts and render the parts unfit for use in semiconductor processing. A method in accordance with one embodiment minimizes damage by limiting exposure of the quartz parts to hydrofluoric acid. A quartz part for use in semiconductor processing comprises a surface including a surface portion having a surface portion area to expose to a gas, wherein at least 95 percent of the surface portion area is free of defects and wherein the surface portion has less than E12 atoms per centimeter squared of aluminum.
申请公布号 US2009218042(A1) 申请公布日期 2009.09.03
申请号 US20090464484 申请日期 2009.05.12
申请人 QUANTUM GLOBAL TECHNOLOGIES, LLC. 发明人 ZUCK DAVID S.;LEGGETT GREGORY H.
分类号 H01L21/3065;C01B33/12;C04B33/34 主分类号 H01L21/3065
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