发明名称 |
PROBE CARD INCLINATION ADJUSTING METHOD, INCLINATION DETECTING METHOD AND STORAGE MEDIUM STORING A PROGRAM FOR PERFORMING THE INCLINATION DETECTING METHOD |
摘要 |
An inclination adjusting method adjusts an inclination of a probe card installed at a probe apparatus to make the probe card be in parallel with a mounting surface of a movable mounting table for mounting thereon an object to be inspected. The method includes: detecting an average tip height of multiple probes disposed at each of plural locations of the probe card by using a tip position detecting device; obtaining an inclination of the probe card with respect to the mounting table based on differences in the average tip heights detected from the plural locations of the probe card; and adjusting the inclination of the probe card based on the obtained inclination.
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申请公布号 |
US2009219046(A1) |
申请公布日期 |
2009.09.03 |
申请号 |
US20090394801 |
申请日期 |
2009.02.27 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
YAMADA HIROSHI;WATANABE TETSUJI;KAWAJI TAKESHI |
分类号 |
G01R31/02 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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