发明名称 PROBE CARD INCLINATION ADJUSTING METHOD, INCLINATION DETECTING METHOD AND STORAGE MEDIUM STORING A PROGRAM FOR PERFORMING THE INCLINATION DETECTING METHOD
摘要 An inclination adjusting method adjusts an inclination of a probe card installed at a probe apparatus to make the probe card be in parallel with a mounting surface of a movable mounting table for mounting thereon an object to be inspected. The method includes: detecting an average tip height of multiple probes disposed at each of plural locations of the probe card by using a tip position detecting device; obtaining an inclination of the probe card with respect to the mounting table based on differences in the average tip heights detected from the plural locations of the probe card; and adjusting the inclination of the probe card based on the obtained inclination.
申请公布号 US2009219046(A1) 申请公布日期 2009.09.03
申请号 US20090394801 申请日期 2009.02.27
申请人 TOKYO ELECTRON LIMITED 发明人 YAMADA HIROSHI;WATANABE TETSUJI;KAWAJI TAKESHI
分类号 G01R31/02 主分类号 G01R31/02
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