发明名称 |
VISUAL EXAMINATION METHOD OF ELECTRONIC COMPONENT |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a visual examination method of an electronic component capable of inspecting the joined state of a shielding lid member and a circuit mounted base in the electronic component provided with the shielding lid member. <P>SOLUTION: In the visual examination method of the electronic component composed of the component mounted base 2 and the metal lid member 3 which covers at least one side of the base 2 and is joined and held to the electrode 4 provided to the base 2 through solder 5, halation is produced by throwing light with a definite luminous intensity on the connection part 6 of the lid member 3 and the base 2 from its back to more darkly express the recessed part 20 between the lid member 3 and the base 2 than another part to detect a defective place. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009198182(A) |
申请公布日期 |
2009.09.03 |
申请号 |
JP20080036825 |
申请日期 |
2008.02.19 |
申请人 |
PANASONIC CORP |
发明人 |
FURUTA YOSHINOBU;NISHINO NAGAKANE;OKAMOTO TAKAO |
分类号 |
G01N21/956;G01B11/24;G01N21/84;H05K13/08 |
主分类号 |
G01N21/956 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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