| 摘要 |
FIELD: physics. ^ SUBSTANCE: analysed object is prepared until its thickness along the optical axis is such that its transmission coefficient is greater than zero, and an analyser and a polariser optically connected to each other, between which the analysed object is placed, are included in the optical system. The object is exposed to radiation from a primary source, wherein intensity of spurious radiation from the primary source, which has bypassed the analysed object, is reduced by turning the analyser, after which the obtained optimum image of the analysed object is observed. The obtained image of the analysed object is compared with a reference image and the composition and properties of the analysed object and differences thereof are determined. ^ EFFECT: invention enables visual and highly reliable determination of the structural composition of the analysed object for identification of said object. ^ 3 dwg |
