| 摘要 |
<p>PURPOSE:To reduce the manhour, and to check deformation of the outside leads of an element at manufacture of the semiconductor element by a method wherein a series of actions of measurement of electric characteristic, indication marking of characteristic, classification and selection is carried out continuously during transference between magazines of two stages of top and bottom. CONSTITUTION:A magazine case 1 for process is installed on an accommodating part 13a, and a magazine case 10 for delivery is installed on an accommodating part 11a. According to starting of the sequence of an automatic selector, a mechanism 14 takes out a semiconductor element from the magazine 1 to send in a conveying rail 9. The element descends along the rail 9, the electric characteristic is measured at a measuring part 2, laser marking of the characteristic is carried out at a mechanism 6 according to the result thereof, and reaches the end terminal of the rail 9. Then the element is accommodated in a magazine case 10 for delivery classified by the characteristic according to a classifying mechanism 4 conforming to the result of the measuring part 2. According to this construction, the manhour of selection work can be reduced, and deformation of the outside leads of the element can be also checked.</p> |
