发明名称 SEMICONDUCTOR DEVICE
摘要 An object is to provide a highly reliable transistor and a semiconductor device including the transistor. A semiconductor device including a gate electrode; a gate insulating film over the gate electrode; an oxide semiconductor film over the gate insulating film; and a source electrode and a drain electrode over the oxide semiconductor film, in which activation energy of the oxide semiconductor film obtained from temperature dependence of a current (on-state current) flowing between the source electrode and the drain electrode when a voltage greater than or equal to a threshold voltage is applied to the gate electrode is greater than or equal to 0 meV and less than or equal to 25 meV, is provided.
申请公布号 WO2011068022(A1) 申请公布日期 2011.06.09
申请号 WO2010JP70161 申请日期 2010.11.05
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD.;YAMAZAKI, SHUNPEI;TSUJI, TAKAHIRO;OCHIAI, TERUAKI;KUSUNOKI, KOJI;MIYAIRI, HIDEKAZU 发明人 YAMAZAKI, SHUNPEI;TSUJI, TAKAHIRO;OCHIAI, TERUAKI;KUSUNOKI, KOJI;MIYAIRI, HIDEKAZU
分类号 H01L29/786;G02F1/1368;H01L21/28;H01L21/336;H01L29/417 主分类号 H01L29/786
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