| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit in which a delay amount of a path between flip-flops can be measured, and to provide a delay measurement method of the semiconductor integrated circuit. SOLUTION: The semiconductor integrated circuit includes a circuit portion to be measured which has a plurality of connected flip-flops, a stop signal generating circuit portion which is connected to each of inputs and outputs of the plurality of flip-flops, and detects transition between the input and the output of the flip-flop and generates a stop signal, and a delay time measuring circuit portion connected to the stop signal generating circuit portion. The delay time measuring circuit portion includes a transition time measuring circuit portion which receives a clock signal and the stop signal and measures a transition time between the clock signal and the stop signal, and a transition time difference measuring circuit portion which measures differences between a plurality of transition times. COPYRIGHT: (C)2011,JPO&INPIT
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