| 摘要 |
PROBLEM TO BE SOLVED: To provide a microscope capable of being adjusted easily with high accuracy. SOLUTION: When the microscope 1 comes into an inclined/fallen state from an observed state, an illumination support 12 inclines/falls, a target plate 22 enters the optical axis of epi-illumination light, the epi-illumination light emitted from an epi-illumination unit 14 having a laser beam source 24 is projected on the target plate 22, and consequently a spot S of the epi-illumination light can be observed through a projection plane of the translucent target plate 22. Thus, a user looks in the target plate 22 from above, rotates fine motion screws 26a and 26b of an adjusting instrument 26 to finely adjust the position of an output end of an optical fiber 25, and moves the spot S of the epi-illumination light in the X and Y directions to come to the center of a concentric circle of a pattern 22a, whereby the microscope can be adjusted easily with high accuracy. The application to inverted microscopes can be achieved. COPYRIGHT: (C)2011,JPO&INPIT
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