<p>PURPOSE: An apparatus for inspecting light emitting diode packages is provided to rapidly implement an inspecting process and a scrapping process with respect to bad light emitting diode packages. CONSTITUTION: A loading part(110) loads the array type group of light emitting diode packages into a cassette. An inspecting part(120) inspects defects in the light emitting diode packages through a visual inspecting process. An unloading part(150) loads a vacant cassette in order to receive the group of the light emitting diode packages. A rejecting part(140) punches and scraps bad light emitting diode packages.</p>
申请公布号
KR20110061336(A)
申请公布日期
2011.06.09
申请号
KR20090117953
申请日期
2009.12.01
申请人
INTEKPLUS CO., LTD.;SAMSUNG LED CO., LTD.
发明人
LIM, SSANG GUN;KO, SEUNG GYU;KWON, DAE KAB;AN, JU HUN;JI, WON SOO