发明名称 TEST PIECE SUPPLY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a test piece supply device, not requiring a wide installation area and accurately moving and supplying plenty of test pieces to a supply position and conveying the test pieces securely held by chucks. SOLUTION: The test piece supply device is equipped with: a conveying mechanism containing a first sprocket 11; a second sprocket 12; an endless chain 13 wound around these first sprocket 11 and the second sprocket 12; and test piece support members 15 attached to this chain 13 at constant pitches. The test piece 100 is clamped by a fall preventive member against the test piece support member 15 before the test piece support member 15 is vertically directed above the first sprocket 11. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011112586(A) 申请公布日期 2011.06.09
申请号 JP20090271043 申请日期 2009.11.30
申请人 SHIMADZU CORP 发明人 MATSUMOTO EIJI
分类号 G01N3/04 主分类号 G01N3/04
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