发明名称 Verfahren zur Herstellung eines Musters aus Vertiefungen in der Oberflaeche eines festen Koerpers
摘要 A pattern of depressions or holes, defined by a pattern mask, is cut into a surface by means of a beam of ions with energies in the 1,000 to 75,000 electron volt range. Patterns including elements 1 micron wide have been reliably produced in thin films on metallic insulating and semiconducting substrates using photolithographic masking techniques.
申请公布号 DE2151200(A1) 申请公布日期 1972.04.20
申请号 DE19712151200 申请日期 1971.10.14
申请人 WESTERN ELECTRIC CO. INC. 发明人 HERMAN SCHMIDT,PAUL;GUERRANT SPENCER,EDWARD
分类号 C23F4/00;H01F10/00;H01L21/00;H01L21/263 主分类号 C23F4/00
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