发明名称 |
Verfahren zur Herstellung eines Musters aus Vertiefungen in der Oberflaeche eines festen Koerpers |
摘要 |
A pattern of depressions or holes, defined by a pattern mask, is cut into a surface by means of a beam of ions with energies in the 1,000 to 75,000 electron volt range. Patterns including elements 1 micron wide have been reliably produced in thin films on metallic insulating and semiconducting substrates using photolithographic masking techniques. |
申请公布号 |
DE2151200(A1) |
申请公布日期 |
1972.04.20 |
申请号 |
DE19712151200 |
申请日期 |
1971.10.14 |
申请人 |
WESTERN ELECTRIC CO. INC. |
发明人 |
HERMAN SCHMIDT,PAUL;GUERRANT SPENCER,EDWARD |
分类号 |
C23F4/00;H01F10/00;H01L21/00;H01L21/263 |
主分类号 |
C23F4/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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