发明名称 METHODS OF PATTERNING MATERIALS, AND METHODS OF FORMING MEMORY CELLS
摘要 Some embodiments include methods of patterning materials. A mass may be formed over a material, and a first mask may be formed over the mass. First spacers may be formed along features of the first mask, and then the first mask may be removed to leave a second mask corresponding to the first spacers. A pattern of the second mask may be partially transferred into the mass to form an upper portion of the mass into a third mask. The first spacers may be removed from over the third mask, and then second spacers be formed along features of the third mask. The second spacers are a fourth mask. A pattern of the fourth mask may be transferred into a bottom portion of the mass, and then the bottom portion may be used as a mask during processing of the underlying material.
申请公布号 WO2011068621(A2) 申请公布日期 2011.06.09
申请号 WO2010US55488 申请日期 2010.11.04
申请人 MICRON TECHNOLOGY, INC.;ARMSTRONG, KYLE;KEWLEY, DAVID, A.;GOODNER, DUANE;KIEHLBAUCH, MARK;LIU, ZENGTAO 发明人 ARMSTRONG, KYLE;KEWLEY, DAVID, A.;GOODNER, DUANE;KIEHLBAUCH, MARK;LIU, ZENGTAO
分类号 H01L21/027 主分类号 H01L21/027
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