发明名称
摘要 PROBLEM TO BE SOLVED: To surely inspect according to the types of RF-ID to cope with a future increase in types of the RF-ID in an inspection system for inspecting the acceptability of the manufactured RF-ID. SOLUTION: In this inspection system for RF-ID, a communication is performed with an RF-ID as an inspected matter at least having an antenna and an IC module to inspect the acceptability of the inspected RF-ID. At least a substrate 42 according to the type of the inspected matter held on a holder 31A mounted on a drive mechanism is formed so as to have the identification terminal 42B of a connection terminal 42A for outputting a signal specifying the type of a system side antenna 42 according to the type of the inspected matter to a processing system side.
申请公布号 JP4698096(B2) 申请公布日期 2011.06.08
申请号 JP20010292078 申请日期 2001.09.25
申请人 发明人
分类号 B42D15/10;G06K17/00;G06K19/07;H04B1/59;H04B17/00 主分类号 B42D15/10
代理机构 代理人
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