发明名称 WAFER TRANSFER APPARATUS FOR WAFER INSPECTION SYSTEM
摘要 <p>PURPOSE: A wafer transferring device of a wafer inspecting apparatus is provided to memorize the rotation quantity of a belt pulley by adopting a motor encoder with a battery after power is interrupted. CONSTITUTION: A belt transfer apparatus(18) is arranged on a vision inspection region. The length of a belt(11) of a belt transfer device is equal to the water supply interval. The belt contact position of wafers(12) are constantly maintained.</p>
申请公布号 KR20110060054(A) 申请公布日期 2011.06.08
申请号 KR20090116525 申请日期 2009.11.30
申请人 HANMISEMICONDUCTOR CO., LTD. 发明人 YOO, JEONG SOO;KIM, DONG EON
分类号 H01L21/677;B65G49/07;H01L21/66 主分类号 H01L21/677
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