发明名称 |
METHOD OF MAMUFACTURING A SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to prevent the penetration of impurities in an interlayer insulating film deposition process by forming a fine film using radical. CONSTITUTION: A source gas and a reaction gas are supplied. The reaction gas is excited to a plasma state in order to generate the radical of the reaction gas. A liner(30) is formed on a substrate(10) using the source gas and the radical of the reaction gas. An interlayer insulating film(40) is formed on the liner using the source gas and an impurity gas. The liner and the interlayer insulating film are formed in an identical reaction chamber using an in-situ method. |
申请公布号 |
KR20110002781(A) |
申请公布日期 |
2011.01.10 |
申请号 |
KR20100027632 |
申请日期 |
2010.03.29 |
申请人 |
ATTO CO., LTD. |
发明人 |
KWON, YOUNG SOO;KONG, CHUL MIN |
分类号 |
H01L21/20;H01L21/205 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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