发明名称 SELF-ALIGNED SPACER MULTIPLE PATTERNING METHODS
摘要 PURPOSE: A method for multi-patterning a self-aligned spacer is provided to form a high density resist pattern by applying a photo-resist layer containing a resin component and a photoactive component to a photo-resist pattern and exposing the photo-resist layer to active radiation ray. CONSTITUTION: A semiconductor substrate(100) including one or more layers to be patterned(102). A first photo-resist layer(106) containing a first resin component and a first photoactive component are applied on the layers to be patterned. The first photo-resist layer is exposed to active radiation ray(108) through a photo mask(110). The first photo-resist layer is developed to form a resist pattern. The resist pattern is thermally treated in a hard baking process.
申请公布号 KR20110002796(A) 申请公布日期 2011.01.10
申请号 KR20100061493 申请日期 2010.06.28
申请人 ROHM AND HAAS ELECTRONIC MATERIALS, L.L.C. 发明人 BAE, YOUNG CHEOL;CARDOLACCIA THOMAS;LIU YI
分类号 H01L21/027 主分类号 H01L21/027
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