发明名称 |
SELF-ALIGNED SPACER MULTIPLE PATTERNING METHODS |
摘要 |
PURPOSE: A method for multi-patterning a self-aligned spacer is provided to form a high density resist pattern by applying a photo-resist layer containing a resin component and a photoactive component to a photo-resist pattern and exposing the photo-resist layer to active radiation ray. CONSTITUTION: A semiconductor substrate(100) including one or more layers to be patterned(102). A first photo-resist layer(106) containing a first resin component and a first photoactive component are applied on the layers to be patterned. The first photo-resist layer is exposed to active radiation ray(108) through a photo mask(110). The first photo-resist layer is developed to form a resist pattern. The resist pattern is thermally treated in a hard baking process. |
申请公布号 |
KR20110002796(A) |
申请公布日期 |
2011.01.10 |
申请号 |
KR20100061493 |
申请日期 |
2010.06.28 |
申请人 |
ROHM AND HAAS ELECTRONIC MATERIALS, L.L.C. |
发明人 |
BAE, YOUNG CHEOL;CARDOLACCIA THOMAS;LIU YI |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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