发明名称 Method and apparatus for detecting degradation in an integrated circuit chip
摘要 A system that detects degradation in an integrated circuit chip. During operation, the system monitors a pair of pins on the integrated circuit chip and in doing so, generates a time series of parameters for the pins. The system then determines whether the time series of parameters indicates that the integrated circuit chip has degraded. If so, the system generates a signal indicating that the integrated circuit chip has degraded.
申请公布号 US7853851(B1) 申请公布日期 2010.12.14
申请号 US20060593744 申请日期 2006.11.06
申请人 ORACLE AMERICA, INC. 发明人 BECKMAN DANIEL J.;CROSS KENNY C.
分类号 G06F11/00 主分类号 G06F11/00
代理机构 代理人
主权项
地址