发明名称 Phase plate for electron microscope and method for manufacturing same
摘要 A phase plate for an electron microscope in which a portion of a magnetic thin-wire ring or a magnetic thin-wire rod spans an opening of a support member having the opening, the magnetic thin-wire ring or magnetic thin-wire rod generates a vector potential, and a phase difference is formed between electron beams that pass through left and right sides of a spanning portion of the magnetic thin-wire ring or the magnetic thin-wire rod. The phase plate prevents the electron beam loss more effectively, can be applied at an accelerating voltage within a wide rage from a low voltage to a high voltage, causes no difficulties in production, has good utility, and makes it possible to obtain a high-contrast image.
申请公布号 US7851757(B2) 申请公布日期 2010.12.14
申请号 US20060084478 申请日期 2006.11.01
申请人 NAGAYAMA IP HOLDINGS, LLC 发明人 NAGAYAMA KUNIAKI
分类号 G01N23/00 主分类号 G01N23/00
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