| 摘要 |
A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The at least one resistive element is embedded within a thermal barrier coating layer deposited on a base portion of the shroud and an abradable coating layer deposited on the thermal barrier coating layer or directly into the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.
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