发明名称 Process for manufacturing probes intended to interact with a storage medium and probe obtained thereby
摘要 A process manufactures a probe intended to interact with a storage medium of a probe-storage system, wherein a sacrificial layer is deposited on top of a substrate; a hole is formed in the sacrificial layer; a mold layer is deposited; the mold layer is etched via the technique for forming spacers so as to form a mold region delimiting an opening having an area decreasing towards the substrate. Then a stack of conductive layers is deposited on top of the sacrificial layer, the stack is etched so as to form a suspended structure, formed by a pair of supporting arms arranged to form a V, and an interaction tip projecting monolithically from the supporting arms. Then a stiffening structure is formed, of insulating material, and the suspended structure is fixed to a supporting wafer. The substrate, the sacrificial layer, and, last, the mold region are then removed.
申请公布号 US7854016(B2) 申请公布日期 2010.12.14
申请号 US20070958977 申请日期 2007.12.18
申请人 STMICROELECTRONICS S.R.L. 发明人 PIROVANO AGOSTINO
分类号 G01Q20/04;G01Q70/12;G01Q70/14;G01Q80/00 主分类号 G01Q20/04
代理机构 代理人
主权项
地址