发明名称 MOSFET device including a source with alternating P-type and N-type regions
摘要 Apparatus and methods are provided for fabricating semiconductor devices with reduced bipolar effects. One apparatus includes a semiconductor body (120) including a surface and a transistor source (300) located in the semiconductor body proximate the surface, and the transistor source includes an area (310) of alternating conductivity regions (3110, 3120). Another apparatus includes a semiconductor body (120) including a first conductivity and a transistor source (500) located in the semiconductor body. The transistor source includes multiple regions (5120) including a second conductivity, wherein the regions and the semiconductor body form an area (510) of alternating regions of the first and second conductivities. One method includes implanting a semiconductor well (120) including a first conductivity in a substrate (110) and implanting a plurality of doped regions (5120) comprising a second conductivity in the semiconductor well. An area (510) comprising regions of alternating conductivities is then formed in the semiconductor well.
申请公布号 US7851889(B2) 申请公布日期 2010.12.14
申请号 US20070742363 申请日期 2007.04.30
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 ZHU RONGHUA;BOSE AMITAVA;KHEMKA VISHNU K.;ROGGENBAUER TODD C.
分类号 H01L21/00 主分类号 H01L21/00
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