| 摘要 |
A semiconductor integrated circuit system has a control target circuit executing a program, a system information monitor unit for outputting system information indicating a state of the control target circuit, a circuit characteristic monitor unit for determining a circuit characteristic of the control target circuit and outputting the circuit characteristic as circuit characteristic information, a malfunction determination unit for determining whether or not the control target circuit is normally operating based on the system information, a reference circuit characteristic holding unit for holding the circuit characteristic information as reference circuit characteristic information when the control target circuit is normally operating, a malfunction factor determination unit for determining a malfunction factor based on the circuit characteristic information and on the reference circuit characteristic information when the control target circuit is not normally operating, and a correction target determination unit for determining a correction target in the control target circuit.
|
